An STM study of Cu on Si(001) in the c(8 × 8) structure

Surface Science

Volumn 453, Issue 1-3, 2000, Pages 137-142

  Liu, B Z ^a   Katkov, M V ^b   Nogami, J ^a,b  

^a Michigan State University   (United States)

^b MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

Copper; Scanning tunneling microscopy; Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

EID: 0347109980     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00329-0     Document Type: Article

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