메뉴 건너뛰기




Volumn 14, Issue 2, 2001, Pages 206-211

SPC in an automated manufacturing environment

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0347085146     PISSN: 0951192X     EISSN: None     Source Type: Journal    
DOI: 10.1080/09511920150216323     Document Type: Article
Times cited : (10)

References (14)
  • 4
    • 21344491572 scopus 로고
    • New approach to quality in a near zero defect environment
    • GOH, T. N., and XIE., M., 1994, New approach to quality in a near zero defect environment. Total Quality Management, 5(3), 3-10.
    • (1994) Total Quality Management , vol.5 , Issue.3 , pp. 3-10
    • Goh, T.N.1    Xie, M.2
  • 5
    • 0346786355 scopus 로고
    • Computer integrated manufacturing (CIM)
    • C. Machover (ed.), Blue Ridge Summit, PA: Tab Books
    • GUNN, T. G., 1989, Computer integrated manufacturing (CIM). In C. Machover (ed.), The C4 Handbook CAD, CAM, CAE, CIM (Blue Ridge Summit, PA: Tab Books), pp. 319-332.
    • (1989) The C4 Handbook CAD, CAM, CAE, CIM , pp. 319-332
    • Gunn, T.G.1
  • 7
    • 0346155915 scopus 로고
    • Quality-automation needs it, CIM speeds it
    • LADUZINSKY, A. J., 1991, Quality-automation needs it, CIM speeds it. Control Engineering, 38, 45-47.
    • (1991) Control Engineering , vol.38 , pp. 45-47
    • Laduzinsky, A.J.1
  • 9
    • 0024088995 scopus 로고
    • Online statistical process control
    • MACGREGOR, J. F., 1988, Online statistical process control. Chemical Engineering Progress, 84(10), 21-31.
    • (1988) Chemical Engineering Progress , vol.84 , Issue.10 , pp. 21-31
    • Macgregor, J.F.1
  • 13
    • 0026909187 scopus 로고
    • Algorithmic statistical process control: Concepts and an application
    • VAN DER WIEL, S., TUCKER, W. T., FALTIN, F. W., and DOGANAKSOY, N., 1992, Algorithmic statistical process control: concepts and an application. Technometrics, 34, 286-297.
    • (1992) Technometrics , vol.34 , pp. 286-297
    • Van Der Wiel, S.1    Tucker, W.T.2    Faltin, F.W.3    Doganaksoy, N.4
  • 14
    • 0032183983 scopus 로고    scopus 로고
    • Computer-aided statistical monitoring of automated manufacturing processes
    • XIE, M., GOH, T. N., and LU, X. S., 1998, Computer-aided statistical monitoring of automated manufacturing processes. Computers & Industrial Engineering, 35(1-2), 189-192.
    • (1998) Computers & Industrial Engineering , vol.35 , Issue.1-2 , pp. 189-192
    • Xie, M.1    Goh, T.N.2    Lu, X.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.