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Volumn 42, Issue 11, 2003, Pages 3194-3197

Two-dimensional map of gloss of plastics measured by diffractive-element-based glossmeter

Author keywords

Diffractive optical element; Glossmeter; Local gloss; Plastics

Indexed keywords

COMPUTER VISION; DIFFRACTIVE OPTICS; LASER BEAM EFFECTS; OPTICAL DEVICES; PLASTICS; SILICA; SPUTTERING; SUBSTRATES; SURFACE PROPERTIES;

EID: 0347063929     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1614263     Document Type: Conference Paper
Times cited : (18)

References (10)
  • 5
    • 0012404595 scopus 로고
    • Stability problems in gloss measurement
    • W. Budde, "Stability problems in gloss measurement," J. Coat. Technol. 52, 44-48 (1980); W. Budde, "Polarization effects in gloss measurements," Appl. Opt. 18, 2252-2257 (1979).
    • (1980) J. Coat. Technol. , vol.52 , pp. 44-48
    • Budde, W.1
  • 6
    • 0018493379 scopus 로고
    • Polarization effects in gloss measurements
    • W. Budde, "Stability problems in gloss measurement," J. Coat. Technol. 52, 44-48 (1980); W. Budde, "Polarization effects in gloss measurements," Appl. Opt. 18, 2252-2257 (1979).
    • (1979) Appl. Opt. , vol.18 , pp. 2252-2257
    • Budde, W.1
  • 8
    • 0037812357 scopus 로고    scopus 로고
    • On-line measurement of the thickness and optical quality of float glass with a sensor based on a diffractive element
    • J. Räsänen and K.-E. Peiponen, "On-line measurement of the thickness and optical quality of float glass with a sensor based on a diffractive element," Appl. Opt. 40, 5034-5039 (2001).
    • (2001) Appl. Opt. , vol.40 , pp. 5034-5039
    • Räsänen, J.1    Peiponen, K.-E.2
  • 10
    • 0040518520 scopus 로고    scopus 로고
    • On the assessment of the surface quality of black print paper by use of a diffractive optical-element-based sensor
    • M. Sorjonen, A. Jääskeläinen, K.-E. Peiponen, and R. Silvennoinen, "On the assessment of the surface quality of black print paper by use of a diffractive optical-element-based sensor," Meas. Sci. Technol. 11, N85-N88 (2000).
    • (2000) Meas. Sci. Technol. , vol.11
    • Sorjonen, M.1    Jääskeläinen, A.2    Peiponen, K.-E.3    Silvennoinen, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.