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Volumn 24, Issue 6, 1998, Pages 297-302
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Using high-technology instruments to assess defects in trees
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Author keywords
Electrical conductivity; Hazardous trees; Penetrometers; Radar; Sonic and ultrasonic detectors; Thermography; Tree stability; Tree structure analysis; VTA; X ray tomography
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Indexed keywords
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EID: 0347040214
PISSN: 02785226
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (30)
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References (11)
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