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Volumn 63, Issue 2, 2004, Pages 115-121
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Imaging the Cell Surface: Argon Sputtering to Expose Inner Cell Structures
b
EPFL
(Switzerland)
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Author keywords
Biomaterials and biological interfaces; Organelles; Subcellular structure and processes; X ray microscopy
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Indexed keywords
ARGON;
ATOMIC FORCE MICROSCOPY;
CELL MEMBRANES;
CYTOLOGY;
ELECTRON EMISSION;
FLUORESCENCE MICROSCOPY;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
ION BEAMS;
SPUTTERING;
ARGON SPUTTERING;
BIOLOGICAL INTERFACE;
BIOMATERIAL AND BIOLOGICAL INTERFACE;
CELL STRUCTURE;
ORGANELLE;
PHOTO-ELECTRON EMISSION;
SUBCELLULAR STRUCTURE;
SUBCELLULAR STRUCTURE AND PROCESS;
X RAY MICROSCOPY;
X-RAY PHOTO;
SCANNING ELECTRON MICROSCOPY;
ARGON;
BIOMATERIAL;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CELL ADHESION;
CELL NUCLEUS MEMBRANE;
CELL STRAIN CACO 2;
CELL STRUCTURE;
CELL SURFACE;
HUMAN;
HUMAN CELL;
IMAGING;
INNER CELL MASS;
PRIORITY JOURNAL;
PROTEIN ASSEMBLY;
SAMPLING;
SECRETORY VESICLE;
X RAY MICROANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 0347003544
PISSN: 1059910X
EISSN: None
Source Type: Journal
DOI: 10.1002/jemt.20019 Document Type: Article |
Times cited : (12)
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References (2)
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