Two oxazolidinone derivatives

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 54, Issue 10, 1998, Pages 1529-1532

  Eknoian, Michael W ^a   Webb, Thomas R ^a   Worley, S Davis ^a   Fleury, Jennifer R ^a   Maddox, Spencer D ^a  

^a AUBURN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347001714     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270198005654     Document Type: Article

References (12)

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3. Dewar, M. J. S. & Stewart, J. J. D. (1988). QCPE Bull. 6, 24. (Program No. 506.)
4. Dewar, M. J. S., Zoebisch, E. G., Healy, E. F & Stewart, J. J. D. (1985). J. Am. Chem. Soc. 107, 3902-3909.
5. Kohl, H. H., Wheatley, W. B., Worley, S. D. & Bodor, N. (1980). J. Pharm. Sci. 69, 1292-1295.
6. Sheldrick, G. M. (1985). SHELXS86. Program for the Solution of Crystal Structures. University of Göttingen, Germany.
7. Sheldrick G. M. (1993). SHELXL93. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
8. Siemens (1990a). SHELXTL-Plus. Version 4.11. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
9. Siemens (1990b). P3 Diffractometer Control Program. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
10. Worley, S. D. & Burlett, H. D. (1984). Water Res. Bull. 20, 365-368.
11. Worley, S. D. & Williams, D. E. (1988) Crit. Rev. Environ. Control, 18, 133-175.
12. Worley, S. D., Williams, D. E. & Barnela, S. B. (1987). Water Res. 21, 983-988.