Diisopropylammonium diphenylmethylnitronate at 200 K

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 55, Issue 7, 1999, Pages 1147-1149

  Sievert, Mark ^a   Nagel, Norbert ^a   Bock, Hans ^a   Dienelt, Rüdiger ^a  

^a GOETHE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346964597     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270199003054     Document Type: Article

References (9)

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3. Bock, H., Dienelt, R., Schoedel, H., Havlas, Z., Herdtweck, E. & Herrmann, W. A. (1993). Angew. Chem. 105, 1826-1828; Angew. Chem. Int. Ed. Engl. 32, 1758-1760.
4. Colvin, E. W., Beck, A. K., Bastani, B., Seebach, D., Yasushi, K. & Dunitz, J. D. (1980). Helv. Chim. Acta, 63, 697-710.
5. Konowalow, M. (1896). Ber. Dtsch Chem. Ges. 29, 2193-2198.
6. Sheldrick, G. M. (1993). SHELXL93. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
7. Sheldrick, G. M. (1994). SHELXS94. Program for the Solution of Crystal Structures. University of Göttingen, Germany.
8. Siemens (1994a). XSCANS User's Manual. Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
9. Siemens (1994b). XP. Molecular Graphics Program. Version 5.03. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.