-
2
-
-
33845551982
-
-
Evans, W. J., Bloom, I., Hunter, W. E. & Atwood, J. L. (1983). J. Am. Chem. Soc. 105, 1401-1403.
-
(1983)
J. Am. Chem. Soc.
, vol.105
, pp. 1401-1403
-
-
Evans, W.J.1
Bloom, I.2
Hunter, W.E.3
Atwood, J.L.4
-
3
-
-
0000892267
-
-
Evans, W. J., Grate, J. W., Bloom, I., Hunter, W. E. & Atwood, J. L. (1985). J. Am. Chem. Soc. 107, 405-409.
-
(1985)
J. Am. Chem. Soc.
, vol.107
, pp. 405-409
-
-
Evans, W.J.1
Grate, J.W.2
Bloom, I.3
Hunter, W.E.4
Atwood, J.L.5
-
4
-
-
0001736801
-
-
Evans, W. J., Keyer, R. A. & Ziller, J. W. (1993). J. Organomet. Chem. 450, 115-120.
-
(1993)
J. Organomet. Chem.
, vol.450
, pp. 115-120
-
-
Evans, W.J.1
Keyer, R.A.2
Ziller, J.W.3
-
5
-
-
33751392494
-
-
Evans, W. J., Kociok-Köhn, G., Leong, V. S. & Ziller, J. W. (1992). Inorg. Chem. 31, 3592-3597.
-
(1992)
Inorg. Chem.
, vol.31
, pp. 3592-3597
-
-
Evans, W.J.1
Kociok-Köhn, G.2
Leong, V.S.3
Ziller, J.W.4
-
6
-
-
0000231310
-
-
Evans, W. J., Ulibarri, T. A. & Ziller, J. W. (1988). J. Am. Chem. Soc. 110, 6877-6883.
-
(1988)
J. Am. Chem. Soc.
, vol.110
, pp. 6877-6883
-
-
Evans, W.J.1
Ulibarri, T.A.2
Ziller, J.W.3
-
7
-
-
0001671495
-
-
Gun'ko, Y. K., Bulychev, B. M., Soloveichik, G. L. & Belsky, V. K. (1992). J. Organomet. Chem. 424, 289-300.
-
(1992)
J. Organomet. Chem.
, vol.424
, pp. 289-300
-
-
Gun'ko, Y.K.1
Bulychev, B.M.2
Soloveichik, G.L.3
Belsky, V.K.4
-
8
-
-
0001168120
-
-
Hitchcock, P. B., Lappert, M. F. & Prashar, S. (1991). J. Organomet. Chem. 413, 79-90.
-
(1991)
J. Organomet. Chem.
, vol.413
, pp. 79-90
-
-
Hitchcock, P.B.1
Lappert, M.F.2
Prashar, S.3
-
9
-
-
84980089549
-
-
North, A. C. T., Phillips, D. C. & Mathews, F. S. (1968). Acta Cryst. A24, 351-359.
-
(1968)
Acta Cryst.
, vol.A24
, pp. 351-359
-
-
North, A.C.T.1
Phillips, D.C.2
Mathews, F.S.3
-
11
-
-
0004150157
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Sheldrick, G. M. (1991). SHELXTL-Plus. Release 4.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1991)
SHELXTL-Plus. Release 4.1
-
-
Sheldrick, G.M.1
-
12
-
-
0003409324
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Siemens (1994). XSCANS User's Manual. Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1994)
XSCANS User's Manual. Version 2.1
-
-
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