X-ray spectroscopy as the method of investigation of the electron structure in disordered semiconductors

Journal of Electron Spectroscopy and Related Phenomena

Volumn 96, Issue 1-3, 1998, Pages 19-22

  Terekhov, V A ^a  

^a VORONEZH STATE UNIVERSITY   (Russian Federation)

Author keywords

Disordered semiconductors; Local density of electron states; X ray spectroscopy

Indexed keywords

EID: 0346942235     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(98)00217-5     Document Type: Article

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