|
Volumn 419, Issue 2-3, 1998, Pages 532-537
|
The CDF silicon detector upgrade
|
Author keywords
Intermediate silicon layers; Silicon detector upgrade
|
Indexed keywords
PARTICLE BEAM TRACKING;
SEMICONDUCTING SILICON;
INTERMEDIATE SILICON LAYERS;
MICROSTRIP DETECTORS;
PSEUDORAPIDITY;
RADIAL GAP;
SEMICONDUCTOR COUNTERS;
|
EID: 0346940884
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(98)00830-4 Document Type: Article |
Times cited : (1)
|
References (7)
|