Erratum: Light-induced bias stress reversal in polyfluorene thin-film transistors (Journal of Applied Physics (2003) 94 (471))

Journal of Applied Physics

Volumn 94, Issue 6, 2003, Pages 4231-

  Salleo, A ^a   Street, R A ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

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[No Author keywords available]

Indexed keywords

EID: 0346937751     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1606411     Document Type: Erratum

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