Fine-structure measurements for negative ions: Studies of Se- and Te-

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 53, Issue 5, 1996, Pages 3023-3028

  Thogersen J ^a   Steele, L D ^a   Scheer, M ^a   Haugen, H K ^a,c   Kristensen, P ^b   Balling, P ^b   Stapelfeldt, H ^b,d   Andersen, T ^b  

^a MCMASTER UNIVERSITY   (Canada)

^b AARHUS UNIVERSITY   (Denmark)

^c Institute for Materials Research

^d NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346903622     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevA.53.3023     Document Type: Article

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