Microanalysis of Metal Film

Journal of Iron and Steel Research International

Volumn 11, Issue 2, 1999, Pages 51-54

  Lin, Qingying ^a   Zhu, Yanyong ^a   Zhang, Yanzheng ^a   Wu, Boqun ^a   Zhang, Xiulin ^b  

^a CENTRAL IRON AND STEEL RESEARCH INSTITUTE   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

Carbon migration; Electron structure; Metal film; Synthetic diamond

Indexed keywords

EID: 0346882065     PISSN: 10010963     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)

1. Williams B E, Glass J T. J Mater Res, 1989, 4(2): 373
2. Chaudhry M I. J Mater Res, 1989, 4(2): 403