The Rare Decay K+ → π+νν and Effects of Charged Technipions

Communications in Theoretical Physics

Volumn 32, Issue 2, 1999, Pages 287-292

  Xiao, Zhen Jun ^a,b   Zhang, Jin Yu ^a   Lü, Lin Xia ^a   Guo, Hong Kai ^a   Lu, Gong Ru ^a  

^a HENAN NORMAL UNIVERSITY   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

Branching ratio; Charged technipion; Rare FCNC decay

Indexed keywords

EID: 0346856932     PISSN: 02536102     EISSN: None     Source Type: Journal    
DOI: 10.1088/0253-6102/32/2/287     Document Type: Article

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