Diffusion of radiolytic molecular hydrogen as a mechanism for the post-irradiation buildup of interface states in SiO2-on-Si structures

Journal of Applied Physics

Volumn 58, Issue 7, 1985, Pages 2524-2533

  Griscom, David L ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

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Indexed keywords

EID: 0346840948     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.335931     Document Type: Article

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