1,3-bis(2-chlorophenyl)thiourea

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 52, Issue 1, 1996, Pages 134-136

  Ramnathan, Akilan ^a   Sivakumar, Kandasamy ^a,c   Subramanian, Kulandaivelu ^a   Janarthanan, Narayanasamy ^b   Ramadas, Krishnamoorthy ^b   Fun, Hoong Kun ^c  

^a ANNA UNIVERSITY   (India)

^b Spic Science Foundation India   (India)

^c SCHOOL OF PHYSICS   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346760783     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270195009693     Document Type: Article

References (12)

1. Akilan, R., Sivakumar, K., Subramanian, K., Janarthanan, N., Ramadas, K. & Fun, H.-K. (1995). Acta Cryst. C51, 2446-2450.
2. Akilan, R., Sivakumar, K., Subramanian, K., Meerarani, D., Ramadas, K. & Fun, H.-K. (1996). Acta Cryst. C52. In the press.
3. Allen, F. H., Kennard, O., Watson, D. G., Brammer, L., Orpen, O. G. & Taylor, R. (1987). J. Chem. Soc. Perkin Trans. 2, pp. S1-S19.
4. Flack, H. D. (1983). Acta Cryst. A39, 876-881.
5. Nardelli, M. (1983). Comput. Chem. 7, 95-98.
6. Ramadas, K. & Janarthanan, N. (1995). Org. Prep. Proced. Int. Submitted.
7. Ramadas, K., Srinivasan, N. & Janarthanan, N. (1993). Tetrahedron Lett. 34, 6447-6450.
8. Sheldrick, G. M. (1990a). Acta Cryst. A46, 467-473.
9. Sheldrick, G. M. (1990b). SHELXTLIPC. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
10. Sheldrick, G. M. (1993). SHELXL93. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
11. Siemens (1994). XSCANS. X-ray Single Crystal Analysis System. Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
12. Stankovic, S. & Andreetti, G. D. (1978). Acta Cryst. B34, 3787-3790.