The analysis of microhardness measurement approach for characterization of hard coatings

Diamond and Related Materials

Volumn 12, Issue 10-11, 2003, Pages 1788-1792

  Trakhtenberg, I Sh ^a   Vladimirov, A B ^a   Rubstein, A P ^a   Kuzmina, E V ^a   Uemura, K ^b   Gontar, A G ^c   Dub, S N ^c  

^a INSTITUTE OF METAL PHYSICS   (Russian Federation)

^b ITAC Ltd   (Japan)

^c BAKUL INSTITUTE FOR SUPERHARD MATERIALS   (Ukraine)

Author keywords

Carbon coating; Microhardness; Thin film

Indexed keywords

COATING TECHNIQUES; MICROHARDNESS; MULTILAYERS; REACTIVE ION ETCHING; SPUTTERING; SURFACE ROUGHNESS; THIN FILMS;

HARD COATINGS; MICROHARDNESS MEASUREMENT;

DIAMOND LIKE CARBON FILMS;

DIAMOND;

EID: 0346750566     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(03)00288-7     Document Type: Article

References (5)

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3. S.N. Dub, in Proceedings of ISDF 4, Kharkov, Ukraina,1999, p. 219
4. I.Sh. Trakhtenberg, S.A. Plotnikov, A.E. Davletshin, I.N. Korneev, A.P. Rubstein, A.B. Vladimirov, O.M. Bakunin, in Proceedings of ADC/FCT -99, p. 623
5. Blank V. Popov M. Pivovarov G. Lvova N. Godolinsky K. Reshetov V. Diamond Relat. Mater. 7 1998 427