SCOPUS 정보 검색 플랫폼

Volumn 12, Issue 10-11, 2003, Pages 1733-1737

Analysis of traps in high quality CVD diamond films through the temperature dependence of carrier dynamics

Author keywords

Carrier dynamics; CVD; Defects; Trapping

Indexed keywords

ACTIVATION ENERGY; CHEMICAL VAPOR DEPOSITION; ELECTRON TRAPS; IRRADIATION; MICROWAVES; PARTICLE DETECTORS; PHOTOLUMINESCENCE;

PARTICLE IRRADIATION; SHALLOW DEFECTS;

DIAMOND FILMS;

DIAMOND;

EID: 0346750562 PISSN: 09259635 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-9635(03)00204-8 Document Type: Article

Times cited : (9)

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