6,6-Bis[3-(dimethylamino)-1,1-dimethylpropyl]-2,2,4,4-tetramethyl-1,3,5- trioxa-2,4-disila-6-stannacyclohexane

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 54, Issue 8, 1998, Pages 1097-1099

  Pieper, Nicole ^a   Schürmann, Markus ^a   Jurkschat, Klaus ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346739335     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270198003199     Document Type: Article

References (16)

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3. Churchill, M. R., Lake, C. H., Chao, S. H. L. & Beachley, O. T. (1993). J. Chem. Soc. Chem. Commun. pp. 1577-1578.
4. Eaborn, C., Hitchcock, P. P., Izod, K. & Smith, J. D. (1995). Angew. Chem. int. Ed. Engl. 34, 2936-2937.
5. Flack, H. D. (1983). Acta Cryst. A39, 876-881.
6. Jurkschat, K., van Dreumel, S., Dyson, G., Dakternieks, D., Bastow, T. J., Smith, M. E. & Dräger, M. (1992). Polyhedron, 11, 2747-2755.
7. Jurkschat, K., Klaus, C., Dargatz, M., Tzschach, A., Meunier-Piret, J. & Mahieu, B. (1989). Z. Allg. Anorg. Chem. 577, 122-134.
8. Otwinowski, Z. & Minor, W. (1997). Processing of X-ray Diffraction Data Collected in Oscillation Mode, in Methods in Enzymology, Vol. 276, Macromolecular Crystallography, Part A, edited by C. W. Carter & R. M. Sweet, pp. 307-326. New York: Academic Press.
9. Pieper, N., Klaus-Mrestani, C., Schürmann, M., Jurkschat, K., Biesemans, M., Verbruggen, I., Martins, J. & Willem, R. (1997). Organometallics, 16, 1043-1052.
10. Pieper, N., Schürmann, M., Jurkschat, K., Biesemans, M., Verbruggen, I. & Willem, R. (1998). In preparation.
11. Puff, H., Schuh, W., Sievers, R., Wald, W. & Zimmer, R. (1984). J. Organomet. Chem. 260, 271-280.
12. Schollmeyer, D., Hartung, H., Klaus, C. & Jurkschat, K. (1991). Main Group Met. Chem. 14, 27-32.
13. Schollmeyer, D., Kalbitz, J., Hartung, H., Tzschach, A. & Jurkschat, K. (1988). Bull. Soc. Chim. Belg. 97, 1075-1080.
14. Sheldrick, G. M. (1990). Acta Cryst. A46, 467-473.
15. Sheldrick, G. M. (1991). SHELXTL-Plus. Release 4.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
16. Sheldrick, G. M. (1993). SHELXL93. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.