An apparatus for measuring the electric conductivity and thermal emf of semiconductors and their melts

Pribory i Tekhnika Eksperimenta

Volumn 46, Issue 6, 2003, Pages 117-120

  Magomedov, Ya B ^a   Aliev, S N ^b   Ajdamirov, M A ^b   Lugueva, N V ^b  

^a INSTITUTE OF PHYSICS   (Russian Federation)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; AUTOCLAVES; ELECTRIC CONDUCTIVITY MEASUREMENT; HIGH TEMPERATURE EFFECTS; MEASUREMENT ERRORS; MELTING; THERMOELECTRICITY;

MELTS;

SEMICONDUCTOR MATERIALS;

EID: 0346687252     PISSN: 00328162     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)