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Volumn 255, Issue 4-6, 1999, Pages 325-330
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Critical effects in screening of high-Z impurities in plasmas
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Author keywords
[No Author keywords available]
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Indexed keywords
INTELLIGENT SYSTEMS;
CRITICAL EFFECTS;
EFFECTIVE CHARGE;
GRAIN SURFACE;
IMPURITIES IN;
LINEAR DEBYE;
NONLINEAR EFFECT;
PLASMA CHARGE;
POISSON-BOLTZMANN THEORY;
MONTE CARLO METHODS;
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EID: 0346616931
PISSN: 03759601
EISSN: None
Source Type: Journal
DOI: 10.1016/S0375-9601(99)00137-1 Document Type: Article |
Times cited : (39)
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References (13)
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