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Volumn 241, Issue 1-2, 1997, Pages 133-137

Experimental validation on granular metallic films of an optical model based on the entropic analysis of their morphology

Author keywords

Entropic analysis; Granular films; Morphology; Optical properties

Indexed keywords

GRANULAR MATERIALS; MATHEMATICAL MODELS; MORPHOLOGY; OPTICAL PROPERTIES; PERCOLATION (SOLID STATE);

EID: 0346614438     PISSN: 03784371     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-4371(97)00072-1     Document Type: Article
Times cited : (2)

References (11)
  • 11
    • 0002444154 scopus 로고
    • Optics of thin films
    • ed. A.C.S. Van Heel North-Holland, Amsterdam
    • F. Abelès, Optics of thin films, in: Advanced Optical Techniques, ed. A.C.S. Van Heel (North-Holland, Amsterdam, 1967) pp. 143-188.
    • (1967) Advanced Optical Techniques , pp. 143-188
    • Abelès, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.