Structural-technological modification of As2S3 glasses

Journal of Optoelectronics and Advanced Materials

Volumn 4, Issue 1, 2002, Pages 45-50

  Luksha, O V ^a   Borkach, E I ^a   Ivanitsky, V P ^a  

^a UZHGOROD NATIONAL UNIVERSITY   (Ukraine)

Author keywords

As2S3 glass; Electron microscopy; Microstructure; X ray diffraction

Indexed keywords

ELECTRON MICROSCOPY; GLASS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROSTRUCTURE; X RAY DIFFRACTION;

DIRECT METHOD; HETEROGENOUS MICROSTRUCTURE; MELT COOLING; MELT TEMPERATURE; MIDDLE RANGE ORDERING; STRUCTURAL MODELS; TECHNOLOGICAL CONDITIONS; TECHNOLOGICAL MODIFICATIONS;

ARSENIC COMPOUNDS;

EID: 0346580795     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

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