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Volumn 35, Issue 9, 1996, Pages 2695-2697

Preparation and Single-Crystal Characterization of iPr2P(S)NHP(S)iPr2 and Homoleptic [iPr2P(S)NP(S)iPr2]- Complexes of Zinc, Cadmium, and Nickel

Author keywords

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Indexed keywords


EID: 0346563686     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic951333d     Document Type: Article
Times cited : (123)

References (22)
  • 17
    • 0004175997 scopus 로고
    • Siemens Analytical X-Ray Instruments Inc. Madison, WI
    • Siemens SHELXTL PLUS. Release 4.2. Siemens Analytical X-Ray Instruments Inc. Madison, WI, 1990.
    • (1990) Siemens SHELXTL PLUS. Release 4.2
  • 18
    • 0003528602 scopus 로고
    • Molecular Structure Corp., The Woodlands, TX
    • teXsan Crystal Structure Analysis Package. Molecular Structure Corp., The Woodlands, TX, 1985 and 1992.
    • (1985) teXsan Crystal Structure Analysis Package


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.