Far-infrared absorption and DC conductivity measurements in SiC

Materials Science and Engineering B

Volumn 56 B56, Issue 1, 1998, Pages 72-75

  Satoh, K ^a   Harada, Y ^b   Nakata, H ^a   Ohyama, T ^a  

^a OSAKA UNIVERSITY   (Japan)

^b OSAKA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Electronic transport; Far infrared; Phonons; SiC

Indexed keywords

DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CURRENT MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; INFRARED RADIATION; LIGHT ABSORPTION; PHONONS; PLASMAS; SINGLE CRYSTALS; THERMAL EFFECTS;

FAR-INFRARED (FIR) ABSORPTION;

SILICON CARBIDE;

EID: 0346542852     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5107(98)00260-8     Document Type: Article

References (9)

1. H. Morkoç, S. Strite, G.B. Gao, M.E. Lin, B. Sverdlov, M. Burns, J. Appl. Phys. 76 (1994) 1363.
2. D.W. Feldman, J.H. Parker Jr, W.J. Choyke, L. Patrick, Phys. Rev. 170 (1968) 698.
3. D.W. Feldman, J.H. Parker Jr, W.J. Choyke, L. Patrick, Phys. Rev. 173 (1968) 787.
4. L. Patrick, Phys. Rev. 167 (1968) 809.
5. H. Fritzsche, J. Phys. Chem. Solids 6 (1958) 69.
6. W.J. Choyke, L. Patrick, Phys. Rev. 127 (1962) 1868.
7. W. Suttrop, G. Pensl, W.J. Choyke, R. Stein, S. Leibenzeder, J. Appl. Phys. 72 (1992) 3708.
8. S.H. Hagen, C.J. Kapteyns, Philips Res. Rep. 25 (1970) 1.
9. L. Patrick, W.J. Choyke, Phys. Rev. B2 (1970) 2255.