Scanning tunnelling microscopy of fullerenes on metal and semiconductor surfaces

Uspekhi Fizicheskikh Nauk

Volumn 167, Issue 3, 1997, Pages 306-307

  Bakhtizin, R Z ^a   Hashizume, T ^b   Wang, X D ^c   Sakurai, T ^c  

^a Science and Education Center of Bashkir People History Ufa University of Science and Technology   (Russian Federation)

^b HITACHI LTD   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346540428     PISSN: 00421294     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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