메뉴 건너뛰기




Volumn 31, Issue 10, 1997, Pages 1049-1052

Effect of deep levels on current excitation in 6H-SiC diodes

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0346509593     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1187023     Document Type: Article
Times cited : (7)

References (31)
  • 4
    • 0000211597 scopus 로고
    • M. M. Anikin, A. S. Zubrilov, A. A. Lebedev, A. M. Strel'chuk, and V. E. Chelnokov, F. M. Berkovskii, S. M. Ryvkin, and N. B. Strokan, Fiz. Tekh. Poluprovodn. 25, 479 (1991) [Sov. Phys. Semicond. 25, 289 (1991)].
    • (1991) Sov. Phys. Semicond. , vol.25 , pp. 289
  • 8
    • 21344475532 scopus 로고
    • G. F. Goluyanov, Fiz. Tekh. Poluprovodn. 4, 3170 (1993) [Semiconductors 27, 925 (1993)].
    • (1993) Semiconductors , vol.27 , pp. 925
  • 10
    • 84933599734 scopus 로고
    • A. I. Veinger and K. P. Fiz. Tekh. Poluprovodn. 2, 294 (1968) [Sov. Phys. Semicond. 2, 247 (1968)].
    • (1968) Sov. Phys. Semicond. , vol.2 , pp. 247
  • 17
    • 21344475532 scopus 로고
    • N. I. Kuznetsov, Fiz. Tekh. Poluprovodn. 27, 1674 (1993) [Semiconductors 27, 925 (1993)].
    • (1993) Semiconductors , vol.27 , pp. 925
  • 22
    • 21344485348 scopus 로고
    • N. I. Kuznetsov, A. P. Dmitriev, and A. S. Furman, Fiz. Tekh. Poluprovodn. 28, 1010 (1994) [Semiconductors 28, 584 (1994)].
    • (1994) Semiconductors , vol.28 , pp. 584
  • 24
    • 0007009544 scopus 로고
    • V. N. Abakumov, V. I. Perel', I. N. Yassievich, Fiz. Tekh. Poluprovodn. 12, 3 (1978) [Sov. Phys. Semicond. 12, 1 (1978)].
    • (1978) Sov. Phys. Semicond. , vol.12 , pp. 1
  • 26
    • 0346152056 scopus 로고
    • O. V. Vakulenko and O. A. Guseva, Fiz. Tekh. Poluprovodn. 15, 1528 (1981) [Sov. Phys. Semicond. 15, 886 (1981)].
    • (1981) Sov. Phys. Semicond. , vol.15 , pp. 886
  • 29
    • 0040365673 scopus 로고
    • V. V. Evstropov, K. V. Kiselev, I. L. Petrovich, and B. V. Tsarenkov, Fiz. Tekh. Poluprovodn. 18, 1852 (1984) [Sov. Phys. Semicond. 18, 1156 (1984)].
    • (1984) Sov. Phys. Semicond. , vol.18 , pp. 1156


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.