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Volumn 27, Issue 1, 2004, Pages 69-77

Estimating the aging trend of dry-type current transformer

Author keywords

Aging index; Aging trend; Linear approximation; Partial discharge

Indexed keywords

AGING OF MATERIALS; APPROXIMATION THEORY; DIAGNOSIS; ELECTRIC FAULT CURRENTS; ELECTRIC INSULATORS; ELECTRIC POTENTIAL; HIGH TEMPERATURE EFFECTS; LEAKAGE CURRENTS; PARTIAL DISCHARGES; POWER SUPPLY CIRCUITS; PREVENTIVE MAINTENANCE; SIGNAL PROCESSING;

EID: 0346500455     PISSN: 02533839     EISSN: 21587299     Source Type: Journal    
DOI: 10.1080/02533839.2004.9670850     Document Type: Article
Times cited : (4)

References (12)
  • 3
    • 0027805928 scopus 로고
    • The Relation between Thermal and Electrical Stress and the PD Behavior of Epoxy-Resin Transformers
    • Borsi, H., 1993. “The Relation between Thermal and Electrical Stress and the PD Behavior of Epoxy-Resin Transformers,”. IEEE Transactions on Electrical Insulation, 28 (6):1007–1015.
    • (1993) IEEE Transactions on Electrical Insulation , vol.28 , Issue.6 , pp. 1007-1015
    • Borsi, H.1
  • 4
    • 0033897465 scopus 로고    scopus 로고
    • A PD Measuring and Evaluation System Based on Digital Signal Processing
    • Borsi, H., 2000. “A PD Measuring and Evaluation System Based on Digital Signal Processing,”. IEEE Transactions on Dielectrics and Electrical Insulation, 7 (1):21–29.
    • (2000) IEEE Transactions on Dielectrics and Electrical Insulation , vol.7 , Issue.1 , pp. 21-29
    • Borsi, H.1
  • 5
    • 0346597698 scopus 로고
    • High Voltage Measurement
    • New York, USA: John Wiley & Sons
    • Gallagher, T. J., and Pearmain, A. J., 1983. “ High Voltage Measurement ”. In Testing and Design, New York, USA:John Wiley & Sons.
    • (1983) Testing and Design
    • Gallagher, T.J.1    Pearmain, A.J.2
  • 6
    • 0347552416 scopus 로고    scopus 로고
    • Lifetime Diagnosis of Transformer
    • Goto, K., and Shiota, H., 2000. “Lifetime Diagnosis of Transformer,”. General Technical Magazine OHM, 1097 (11):43–48.
    • (2000) General Technical Magazine OHM , vol.1097 , Issue.11 , pp. 43-48
    • Goto, K.1    Shiota, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.