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Volumn 21, Issue 1, 2000, Pages 97-98
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Textural Characterization of SiO2-PEG Xerogels
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Author keywords
Controlled structure; Pore distribution; SiO2 PEG; Sol Gel
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Indexed keywords
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EID: 0346387159
PISSN: 02510790
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (6)
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References (23)
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