Optical gain and collector current characteristics of resonant-cavity phototransistors

Applied Physics Letters

Volumn 76, Issue 9, 2000, Pages 1188-1190

  Lin, Chien Chung ^a   Martin, Wayne ^a   Harris Jr , James S ^a   Sugihwo, Fred ^b  

^a STANFORD UNIVERSITY   (United States)

^b AGILENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346356053     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125978     Document Type: Article

References (15)

1. J. C. Campbell, in Semiconductors and Semimetals, edited by W. T. Tsang (Academic, Orlando, FL, 1985), Vol. 22, p. 389.
2. K. Tabatabaie-Alavi and C. G. Fonstad, Jr., IEEE J. Quantum Electron. 17, 2259 (1981).
3. L. J. Irakliotis, P. J. Stanko, C. W. Wilmsen, and P. A. Mitkas, IEEE Photonics Technol. Lett. 9, 502 (1997).
4. B. Lu, P. Zhou, Y.-C. Lu, J. Cheng, R. E. Leibenguth, A. C. Adams, J. L. Zilko, J. C. Zolper, K. L. Lear, S. A. Chalmers, and G. A. Vawter, IEEE Photonics Technol. Lett. 6, 222 (1994).
5. J. A. Lott, H.-K. Shin, and Y.-H. Lee, in The Conference Digest of the 15th International Semiconductor Laser Conference (IEEE, Piscataway, NJ, 1996), p. 185.
6. T. Vo-Dinh, J. P. Alarie, N. Isola, D. Landis, A. L. Wintenberg, and M. N. Ericson, Anal. Chem. 71, 358 (1999).
7. E. Ramos, P. Parmananda, G. Hernandez-Cruz, and M. Sen, Exp. Heat Transfer 10, 273 (1997).
8. D. I. Hoult and C. M. Preston, Rev. Sci. Instrum. 63, 1927 (1992).
9. M. Selim ÜnIu and S. Strite, J. Appl. Phys. 78, 607 (1995).
10. N. Chand, P. A. Houston, and P. N. Robson, IEEE Trans. Electron Devices 32, 622 (1985).
11. J. C. Campbell, A. G. Dentai, C. A. Burrus, Jr., and J. F. Ferguson, IEEE J. Quantum Electron. 17, 264 (1981).
12. J. C. Campbell, A. G. Dentai, G.-J. Qua, and J. F. Ferguson, IEEE J. Quantum Electron. 19, 1134 (1983).
13. J. C. Campbell, C. A. Burrus, A. G. Dentai, and K. Ogawa, Appl. Phys. Lett. 39, 820 (1981).
14. S. Tiwari and D. J. Frank, IEEE Trans. Electron Devices 36, 2105 (1989).
15. F. Sugihwo, C.-C. Lin, L. A. Eyres, M. M. Fejer, and J. S. Harris, Jr., in The Technical Digest of International Electron Device Meeting (IEEE, Piscataway, NJ, 1998), p. 665.