Studying membranes with scanning force microscopy and patch-clamp technique

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1449-1452

  Mosbacher, J ^a   Haberle W ^b   Korber J K H ^a  

^a EUROPEAN MOLECULAR BIOLOGY LABORATORY   (Germany)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346351256     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589117     Document Type: Article

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