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Volumn 22, Issue 7, 1997, Pages 481-493

Characterization of porous and compact oxide films on titanium and Ti-6A1-4V;Caracterisation d'oxydes anodiques poreux et compacts de titane et de Ta6V

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0346349702     PISSN: 01519107     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (13)

References (15)
  • 2
    • 84953408735 scopus 로고
    • The Surface Chemistry of Silicon in Fluoride Electrolytes
    • Ed. H. Gerisher &C.W. Tobias, VCH, Weinheim
    • SEARSON (P.C.), The Surface Chemistry of Silicon in Fluoride Electrolytes. Advances in Electrochemical Science and Enginering, 1995, Vol.4; Ed. H. Gerisher &C.W. Tobias, VCH, Weinheim.
    • (1995) Advances in Electrochemical Science and Enginering , vol.4
    • Searson, P.C.1
  • 10
    • 33751351587 scopus 로고
    • Thèse de Doctorat, Université de technologie de Compiègne
    • FERDJANI (S.), Thèse de Doctorat, Université de technologie de Compiègne, 1986.
    • (1986)
    • Ferdjani, S.1
  • 11
    • 33751321553 scopus 로고    scopus 로고
    • WAGNER (C.D.), RIGGS (W.M.), DAVIS (L.E.), MOULDER (J.F.). Ed. MULLENGER, Perkin-Elmer Corporation, Physical Electronics, Division Eden Prairie, Mineapolis, 1979
    • WAGNER (C.D.), RIGGS (W.M.), DAVIS (L.E.), MOULDER (J.F.). Ed. MULLENGER, Perkin-Elmer Corporation, Physical Electronics, Division Eden Prairie, Mineapolis, 1979.
  • 13
    • 33751312179 scopus 로고
    • thesis, Blacksburg, Virginia Polytechnic Institute and State University
    • CHENG (A.M.T.), thesis, Blacksburg, Virginia Polytechnic Institute and State University, 1984.
    • (1984)
    • Cheng, A.M.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.