Low angle and low energy ion beam etching for TEM sample preparation

Journal of Computer-Assisted Microscopy

Volumn 9, Issue 2, 1997, Pages 101-104

  Barna, A ^a  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346341041     PISSN: 10407286     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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