Structural and statistical analysis of Yb/Si(1 1 1) and Eu/Si(1 1 1) reconstructions

Surface Science

Volumn 549, Issue 3, 2004, Pages 183-195

  Kuzmin, M ^a,b   Vaara, R L ^a   Laukkanen, P ^a   Perala R E ^a   Vayrynen I J ^a  

^a UNIVERSITY OF TURKU   (Finland)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

Lanthanides; Low energy electron diffraction (LEED); Scanning tunneling microscopy; Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

EUROPIUM; LOW ENERGY ELECTRON DIFFRACTION; MAGNETIC PROPERTIES; MAGNETIZATION; MONOLAYERS; MORPHOLOGY; PARAMAGNETISM; SCANNING TUNNELING MICROSCOPY; SILICON; STATISTICAL METHODS; SURFACE ROUGHNESS; YTTERBIUM;

CHAIN STRUCTURES;

SURFACE STRUCTURE;

EID: 0346338335     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2003.12.005     Document Type: Article

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