A study on the ageing process for polyester resin using improved Weibull statistics

Electrical Engineering

Volumn 85, Issue 5, 2003, Pages 283-288

  Ugur, M ^a   Kuntman, A ^a   Ersoy, A ^a  

^a ISTANBUL UNIVERSITY   (Turkey)

Author keywords

Life prediction; Polyesters; Polymer ageing; Surface tracking test; Weibull statistics

Indexed keywords

AGING OF MATERIALS; ELECTRIC BREAKDOWN; ELECTRIC INSULATORS; FLOW OF FLUIDS; IMPURITIES; MATERIALS TESTING; MATHEMATICAL MODELS; MOISTURE; PROBABILITY; RELIABILITY; RESINS; STRESSES; SURFACE PROPERTIES; WEIBULL DISTRIBUTION;

SURFACE TRACKING TESTS;

POLYESTERS;

EID: 0346328575     PISSN: 09487921     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00202-003-0175-5     Document Type: Article

References (27)

1. Weibull W (1961) Fatigue testing and analysis of results. Pergamon, Oxford
2. Wang W, Kececioglu DB (2000) Fitting the Weibull log-linear model to accelerated life-test data. IEEE Trans Reliab 49:217-223
3. Watkins AJ (1994) Review: likehood method for fitting Weibull log-linear models to accelerated life-test data. IEEE Trans Reliab 49:361-365
4. Tseng ST, Chyau CH (1994) A classification rule arising from accelerated life tests. Reliab Eng Syst Safety 43:247-256
5. Newby M (1994) Perspective on Weibull proportional-hazard models. IEEE Trans Reliab 43:217-223
6. Hagwood C, Clough R, Fields R (1999) Estimation of the stress-threshold for the Weibull inverse power law. IEEE Trans Reliab 48:176-181
7. Ugur M, Kuntman A, Merev A (2002) Investigation the ageing process in polymeric insulators using improved Weibull statistics. Paper presented at the International Symposium on Electrical Insulation (2002 ISEI) 7-10 April 2002, Boston, USA
8. Ardali A, Kuntman A, Kaçar F, Kuntman H (2001) An application of Weibull distribution to hot carrier degradation in threshold voltage and drain current of mos transistors. The 2nd International Conference on Electrical and Electronics Engineering, EL-ECO'2001, Bursa, Turkey, pp 86-91
9. Wu EY, Nowak EJ, lersten NRP, Han L-K (2000) Weibull breakdown characteristics and oxide thickness uniformity. IEEE Trans Electron Devices 47:2301-2309
10. Ross R (1999) Comparing linear regression and maximum likelihood methods to estimate Weibull distributions on limited data sets: systematic and random errors. In: Conference on Electrical Insulation and Dielectric Phenomena, Annual Conference Report, Austin, Tex., pp 170-173
11. Watson JF, Mason JH, Lynch AC (1979) Assessing materials for use as outdoor insulation. Int Symp High Voltage 3:4
12. Mason JH (1983) Summary of factors which affect the results of inclined plane tests. CIGRE 1-3
13. Weller MC (1999) Variation in the results of inclined plane tracking tests: some factors controlling the surface tracking activity. In: Dielectric Materials, Measurements and Applications, Conference on Solid Dielectrics, London, UK, pp 282-286
14. Billings ML, Walkings R, Warren L (1968) A comparison of the IEC Dust/ Fog and Inclined plane test. IEEE Trans Electr Insul 3:33-39
15. ASTM (1983) Standard test methods for liquid contaminant, inclined plane tracking and erosion of insulating materials, ASTM (2303), pp 258-270
16. Cacciari M, Montanari GC (1992) Electrical life threshold models for solid insulating materials subjected to electrical and multiple stresses: probabilistic approach to generalized life models. IEEE Trans Electr Insul 27:987-999
17. Montanari GC (1992) Electrical life threshold models for solid insulating materials subjected to electrical and multiple stresses: investigation and comparison of life models. IEEE Trans Electr Insul 27:974-986
18. Auckland DW, Ugur M, Varlow BR (1995) A surface tracking model for failure prediction. In: International Conference on Conduction and Breakdown in Solid Dielectrics (ICSD95), Leicester, UK, pp 503-507
19. Risino AJ (1994) New test methods for assessing the relative tracking performance of insulating materials. PhD Dissertation, University of Manchester
20. Houlgate R (1996) Outdoor testing on non ceramic insulators. In: IEE Colloquium on a Review of Outdoor Insulation Materials. IEEE, Piscataway, N.J., pp 8.1-8.4
21. Crine P, Vijh AK (1985) A molecular approach to the physico-chemical factors in the electrical breakdown of polymers. Appl Phys Commun 5:139-163
22. Wintle HJ (1983) Conduction processes in polymers. In: Bartnikas R, Eichhorn RM (eds) Engineering dielectrics, vol IIA. ASTM Special Technical Publication 763, pp 239-354
23. Wiesmann HJ, Zeller HR (1986) A fractal model of dielectric breakdown and prebreakdown in solid dielectrics. J Appl Phys 60:1170-1173
24. Crine P (1992) Applications of the rate theory to the understanding of various dielectric aging mechanisms. Paper presented at the Conference on Electrical Insulation and Dielectric Phenomena, Victoria, Canada
25. Montanari GC, Simoni L (1993) Aging phenomenology and modeling. IEEE Trans Dielectr Electri lnsul 28:755-776
26. Stone GC, Heeswijk RGV (1977) Parameter estimation for the Weibull distribution. IEEE Trans Electr Insul 12:253-261
27. Chatfield C (1991) Statistics for technolgy, 3rd edn. Chapman & Hall, Bristol