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Volumn 778, Issue , 2003, Pages 321-326
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Geometrical contribution to yield strength in small volumes
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Author keywords
[No Author keywords available]
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Indexed keywords
DISLOCATIONS (CRYSTALS);
INDENTATION;
PLASTIC DEFORMATION;
SEMICONDUCTOR MATERIALS;
STRAIN;
STRAIN HARDENING;
TORSIONAL STRESS;
WIRE;
CRITICAL THICKNESS THEORY;
LINEAR STRAIN GRADIENTS;
THERMODYNAMIC EQUILIBRIUM THEORY;
YIELD STRESS;
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EID: 0346307548
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-778-u9.10 Document Type: Conference Paper |
Times cited : (1)
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References (17)
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