Probing UPD-Induced Surface Atomic Rearrangement of Polycrystalline Gold Nanofilms with Surface Plasmon Resonance Spectroscopy and Cyclic Voltammetry

Journal of Physical Chemistry B

Volumn 107, Issue 50, 2003, Pages 13969-13975

  Jin, Yongdong ^a   Dong, Shaojun ^a  

^a CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; CYCLIC VOLTAMMETRY; ELECTROCHEMICAL ELECTRODES; GOLD; LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; MORPHOLOGY; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA; SURFACE PLASMON RESONANCE; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC REARRANGEMENTS; UNDERPOTENTIAL DEPOSITION (UPD);

NANOSTRUCTURED MATERIALS;

EID: 0346307152     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp035851i     Document Type: Article

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