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Volumn 55, Issue 6, 1999, Pages 841-843

γ-Mo4O11

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0346303937     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270199000165     Document Type: Article
Times cited : (10)

References (15)
  • 5
    • 0003495856 scopus 로고    scopus 로고
    • Set 5. The Joint Committee on Powder Diffraction Standards, 1845 Walnut Street, Philadelphia, Pennsylvania 19103, USA
    • JCPDS (5-337). Powder Diffraction File, Set 5. The Joint Committee on Powder Diffraction Standards, 1845 Walnut Street, Philadelphia, Pennsylvania 19103, USA.
    • Powder Diffraction File
  • 12
    • 0004150157 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1996a). SHELXTL Reference Manual. Version 5. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1996) SHELXTL Reference Manual. Version 5
  • 13
    • 0004247942 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1996b). SMART Software Reference Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1996) SMART Software Reference Manual
  • 14
    • 0003483605 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1996c). SAINT Software Reference Manual. Version 4. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1996) SAINT Software Reference Manual. Version 4
  • 15
    • 0009268731 scopus 로고
    • New York/London/Sydney: Interscience Publishers (a division of John Wiley & Sons)
    • Wyckoff, R. W. G. (1967). Crystal Structures, Vol. 2, pp. 84-85. New York/London/Sydney: Interscience Publishers (a division of John Wiley & Sons).
    • (1967) Crystal Structures , vol.2 , pp. 84-85
    • Wyckoff, R.W.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.