A polynomial time algorithm for local testability and its level

International Journal of Algebra and Computation

Volumn 9, Issue 1, 1999, Pages 31-39

  Trahtman, A N ^a  

^a BAR ILAN UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346303936     PISSN: 02181967     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218196799000035     Document Type: Article

References (8)

1. J. A. Brzozowski and I. Simon, Characterization of locally testable events, Discrete Math. 4 (1973), 243-271.
2. S. Kim, R. McNaughton and R. McCloskey, An upper bound on the order of locally testable deterministic finite automaton, Lecture Notes in Comp. 401 (1989), 48-65.
3. S. Kim, R. McNaughton and R. McCloskey, A polynomial time algorithm for the local testability problem of deterministic finite automata, IEEE Trans. Comput. 40 (N10) (1991), 1087-1093.
4. G. Lallement, Semigroups and Combinatorial Applications, Wiley, NY, 1979.
5. R. McNaughton and S. Papert, Counter-Free Automata, M.I.T. Press MA, 1971.
6. A. N. Trahtman, The varieties of testable semigroups, Semigroup Forum 27 (1983), 309-318.
7. A. N. Trahtman, Identities of a five-element 0-simple semigroup, Semigroup Forum 48 (1994), 385-387.
8. Y. Zalcstein, Locally testable semigroups, Semigroup Forum 5 (1973), 151-167.