Because every pupil counts: The success of the pupil monitoring system in the Netherlands

Education and Information Technologies

Volumn 2, Issue 4, 1997, Pages 287-306

  Vlug, Karin F M ^a  

^a Cito group   (Netherlands)

Author keywords

Assessment testing; Elementary education; Evaluation; Quality; Software

Indexed keywords

EID: 0346274486     PISSN: 13602357     EISSN: 15737608     Source Type: Journal    
DOI: 10.1023/A:1018629701040     Document Type: Article

References (17)

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