A combined in situ optical reflectance-electron diffraction study of Co/Cu and Co/Au multilayers grown by molecular beam epitaxy

Applied Physics Letters

Volumn 68, Issue 26, 1996, Pages 3740-3742

  Emmerson, C M ^a   Shen, T H ^a   Evans, S D ^a   Allinson, H ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346269877     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115991     Document Type: Article

References (15)

1. S. S. P. Parkin, Z. G. Li, and D. J. Smith, Appl. Phys. Lett. AIP 58, 2710 (1991).
2. D. E. Aspnes, J. P. Harbison, A. A. Studna, L. T. Florez, and M. K. Kelly, J. Vac. Sci. Technol. A AIP 6, 1327 (1988).
3. U. Rossow, U. Frotscher, W. Richter, H. Wilhelm, and D. Zahn, Surf. Sci. INS 287/288, 718 (1993).
4. W. Richter, Philos. Trans. R. Soc. London Ser. A INS 344, 453 (1993).
5. Y. Borensztein, W. L. Mochan, J. Tarriba, R. G. Barrera, and A. Tadjeddine, Phys. Rev. Lett. AIP 71, 2335 (1993).
6. P. Hofmann, K. C. Rose, V. Fernandez, A. M. Bradshaw, and W. Richter, Phys. Rev. Lett. AIP 75, 2039 (1995).
7. P. Dodd, J. Lunney, and J. Armstrong, Opt. Eng. INS 33, 3969 (1994).
8. T. Farrell and J. V. Armstrong, Semicond. Sci. Technol. INS 7, 1495 (1992).
9. C. Emmerson and T-H. Shen, J. Magn. Magn. Mater. (in press).
10. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1989), p. 332.
11. H. V. Nguyen, I. An, and R. W. Collins, in Optical Characterisation of Real Surface and Films, edited by K. Vedam (Academic, Boston, 1993).
12. T-H. Shen and C. C. Matthai, Surf. Sci. INS 287/288, 672 (1993).
13. P. B. Johnson and R. W. Christy, Phys. Rev. B AIP 6, 4370 (1972).
14. P. B. Johnson and R. W. Christy, Phys. Rev. B AIP 9, 5056 (1974).
15. F. Wooten, Optical Properties of Solids (Academic, New York, 1972).