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Volumn 72, Issue 11, 2003, Pages 2924-2929
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Structural study of inhomogeneous charge distribution of inequivalent CuO2 planes in Bi2.1Sr1.9Ca2Cu 3O10+δ single crystals
c
NTT CORPORATION
(Japan)
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Author keywords
Bi2.1Sr1.9Ca2Cu3O 10+ ; Bond valence sum (BVS) method; Four circle x ray diffraction measurement; High Tc cuprate; Out of plane resistivity; Single crystal
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Indexed keywords
BISMUTH;
CALCIUM;
COPPER;
OXYGEN;
STRONTIUM;
ARTICLE;
CALCULATION;
CONDUCTANCE;
CRYSTAL;
NUCLEAR MAGNETIC RESONANCE;
TEMPERATURE;
X RAY DIFFRACTION;
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EID: 0346264859
PISSN: 00319015
EISSN: None
Source Type: Journal
DOI: 10.1143/JPSJ.72.2924 Document Type: Article |
Times cited : (9)
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References (19)
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