Simple and efficient technique for evaluating the optical losses from surface attering and volume attenuation in a thin film

Optics Express

Volumn 10, Issue 25, 2002, Pages 1485-1490

  Zhang, Xi Jing ^a   Fan, Xi Zhi ^a   Wang, Hui Tian ^a   He, Jing Liang ^a   Ming, N B ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC DEVICES; LENSES; MICROSCOPIC EXAMINATION; OPTICAL WAVEGUIDES; OPTOELECTRONIC DEVICES; REFRACTIVE INDEX; SURFACE ROUGHNESS;

PLANAR WAVEGUIDES; ROUGH SURFACE SCATTERING; SCATTERING MEASUREMENTS; VOLUME ABSORPTION;

THIN FILMS;

EID: 0346262361     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.10.001485     Document Type: Article

References (9)

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