Advanced one-dimensional x-ray microscope for the Omega Laser Facility

Review of Scientific Instruments

Volumn 70, Issue 1 II, 1999, Pages 608-612

  Bennett, Guy R ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; DIFFRACTION; ERROR ANALYSIS; LASER APPLICATIONS; MATHEMATICAL MODELS; ONE DIMENSIONAL; OPTICAL RESOLVING POWER; OPTIMIZATION; POLYNOMIALS; RAY TRACING;

OMEGA LASER FACILITY; ZERNIKE SURFACE DEFORMATIONS;

X RAY MICROSCOPES;

EID: 0346243980     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149433     Document Type: Article

References (8)

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3. G. R. Bennett (unpublished). This article discusses: the spherical aberration of grazing incidence spheric-based systems; the means by which this most dominant of imaging defects may be corrected; a technique to optimize the corrected system over the chosen object field: mirror micro-roughness effects and the relevant x-ray scattering MTF components: etc. However, no details of the 4.316 keV 1DKB device are described here.
4. J. Dyson, Proc. Phys. Soc. London, Sect. B 65, 580 (1952).
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7. E. Spiller, D. Stearns, and M. Krumrey, J. Appl. Opt. 74, 107 (1993).
8. J. B. Kortright, J. Appl. Phys. 70, 3620 (1991).