Calculation of Stress Intensity Factors Using Three-Dimensional Molecular Dynamics Simulation

Metals and Materials International

Volumn 4, Issue 4, 1998, Pages 920-924

  Choi, Deok Kee ^a   Kim, Jih Woon ^a  

^a Dankook University   (South Korea)

Author keywords

Embedded atomic model (EAM); Molecular dynamic simulation; Stress indensity factors

Indexed keywords

MOLECULAR MODELING; STRESS INTENSITY FACTORS; THREE DIMENSIONAL COMPUTER GRAPHICS;

ATOMIC MODELING; EDGE CRACKS; HIGH PERFORMANCE COMPUTERS; LARGE AMOUNTS; LENNARD-JONES MODEL; MOLECULAR DYNAMICS SIMULATIONS; STRESS INTENSITY FACTOR (SIF);

MOLECULAR DYNAMICS;

EID: 0346243691     PISSN: 12259438     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF03026424     Document Type: Article

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