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Applied Physics Letters

Volumn 27, Issue 9, 1975, Pages 505-507

Interface effects and high conductivity in oxides grown from polycrystalline silicon

(2) Dimaria, D J a Kerr, D R b

a IBM T J WATSON RESEARCH CENTER (United States)

b IBM (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346231380 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.88536 Document Type: Article

Times cited : (121)

References (15)

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