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Volumn 9, Issue 4, 1997, Pages 881-888

A new critical point in the non-linear conductivity due to variable-range hopping in Si

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EID: 0346186320     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/9/4/008     Document Type: Article
Times cited : (9)

References (22)
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    • (1993) J. Low Temp. Phys. , vol.93 , pp. 821
    • Sadoulet, B.1
  • 3
    • 0011674761 scopus 로고    scopus 로고
    • Proc. 5th Int. Workshop on Low Temperature Detectors
    • Sadoulet B 1993 J. Low Temp. Phys. 93 821; see J Low Temp. Phys. 93 for Proc. 5th Int. Workshop on Low Temperature Detectors
    • J Low Temp. Phys. , vol.93
  • 4
    • 0026136403 scopus 로고
    • van der Heijden R W, Chen G, de Waele A I A M, Gijsman H M and Tielen F P B 1991 Solid State Commun. 78 5 Dai P, Zhang J and Sarachik M P 1992 Phys. Rev. Lett. 69 1804 Zhang J, Cui W, Juda M, McCammon D, Kelley R, Moseley S H, Stahle C K and Szymkowiak A E 1993 Phys. Rev. B 48 2312 Shlimak I S, Kaveh M, Ussyshkin R, Ginodman V, Baranonovski S D, Thomas P, Vaupel H and van der Heijden R W 1995 Phys. Rev. Lett. 75 4764
    • (1991) Solid State Commun. , vol.78 , pp. 5
    • Van Der Heijden, R.W.1    Chen, G.2    De Waele, A.I.A.M.3    Gijsman, H.M.4    Tielen, F.P.B.5
  • 5
    • 0000223320 scopus 로고
    • van der Heijden R W, Chen G, de Waele A I A M, Gijsman H M and Tielen F P B 1991 Solid State Commun. 78 5 Dai P, Zhang J and Sarachik M P 1992 Phys. Rev. Lett. 69 1804 Zhang J, Cui W, Juda M, McCammon D, Kelley R, Moseley S H, Stahle C K and Szymkowiak A E 1993 Phys. Rev. B 48 2312 Shlimak I S, Kaveh M, Ussyshkin R, Ginodman V, Baranonovski S D, Thomas P, Vaupel H and van der Heijden R W 1995 Phys. Rev. Lett. 75 4764
    • (1992) Phys. Rev. Lett. , vol.69 , pp. 1804
    • Dai, P.1    Zhang, J.2    Sarachik, M.P.3
  • 6
    • 0005611821 scopus 로고
    • van der Heijden R W, Chen G, de Waele A I A M, Gijsman H M and Tielen F P B 1991 Solid State Commun. 78 5 Dai P, Zhang J and Sarachik M P 1992 Phys. Rev. Lett. 69 1804 Zhang J, Cui W, Juda M, McCammon D, Kelley R, Moseley S H, Stahle C K and Szymkowiak A E 1993 Phys. Rev. B 48 2312 Shlimak I S, Kaveh M, Ussyshkin R, Ginodman V, Baranonovski S D, Thomas P, Vaupel H and van der Heijden R W 1995 Phys. Rev. Lett. 75 4764
    • (1993) Phys. Rev. B , vol.48 , pp. 2312
    • Zhang, J.1    Cui, W.2    Juda, M.3    McCammon, D.4    Kelley, R.5    Moseley, S.H.6    Stahle, C.K.7    Szymkowiak, A.E.8
  • 19
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    • note
    • A similar feature can be seen in figure 1 of [8] in an ion-implanted Si:As sensor at 78 mK.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.