SCOPUS 정보 검색 플랫폼

Volumn 548, Issue 1-3, 2004, Pages 59-66

Fabrication and optical characterization of a TiO2 thin film on a silica microsphere

(6) Haraguchi, M a Komatsu, F a Tajiri, K a Okamoto, T a Fukui, M a Kato, S b

Author keywords

Coatings; Raman scattering spectroscopy; Reflection spectroscopy; Scanning electron microscopy (SEM); Silicon oxides; Titanium oxide

Indexed keywords

CRYSTALLINE MATERIALS; DOPING (ADDITIVES); GROWTH (MATERIALS); LIGHT REFLECTION; LUMINESCENCE; MONOLAYERS; NANOSTRUCTURED MATERIALS; POLYSTYRENES; RAMAN SCATTERING; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SILICA; SINTERING; SOL-GELS; SYNTHESIS (CHEMICAL); TITANIUM DIOXIDE;

ATTENUATED-TOTAL-REFLECTION (ATR) METHOD; MEMBRANE FILTERS; OPTICAL RESONANCE; REFLECTION SPECTROSCOPY;

THIN FILMS;

EID: 0346150429 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2003.10.037 Document Type: Article

Times cited : (26)

References (15)

1
- 0000747040
- Srinivasan S., Datye A.K., Hampden-Smith M., Wachs I.E., Deo G., Jehng J.M., Turek A.M., Peden C.H.F. J. Catal. 131:1991;260.
- (1991) J. Catal. , vol.131 , pp. 260
- Srinivasan, S.¹ Datye, A.K.² Hampden-Smith, M.³ Wachs, I.E.⁴ Deo, G.⁵ Jehng, J.M.⁶ Turek, A.M.⁷ Peden, C.H.F.⁸

2
- 0030156228
- Hanprasopwattana A., Srinivasan S., Sault A.G., Datye A.K. Langmuir. 12:1996;3173.
- (1996) Langmuir , vol.12 , pp. 3173
- Hanprasopwattana, A.¹ Srinivasan, S.² Sault, A.G.³ Datye, A.K.⁴

3
- 0034284150
- Holgado M., Cintas A., Ibisate M., Serna C.J., Lopez C., Meseguer F. J. Col. Int. Sci. 229:2000;6.
- (2000) J. Col. Int. Sci. , vol.229 , pp. 6
- Holgado, M.¹ Cintas, A.² Ibisate, M.³ Serna, C.J.⁴ Lopez, C.⁵ Meseguer, F.⁶

4
- 0028728877
- Gorodetsky M.L., Ilchenko V.S. Opt. Commun. 113:1994;133.
- (1994) Opt. Commun. , vol.113 , pp. 133
- Gorodetsky, M.L.¹ Ilchenko, V.S.²

5
- 0029289945
- Serpenguzel A., Arnold S., Griffel G. Opt. Lett. 20:1995;654.
- (1995) Opt. Lett. , vol.20 , pp. 654
- Serpenguzel, A.¹ Arnold, S.² Griffel, G.³

6
- 84975562123
- Debreuil N., Knight J.C., Leventhal D., Sandoghdar V., Hare J., Lefevre-Seguin V. Opt. Lett. 20:1995;813.
- (1995) Opt. Lett. , vol.20 , pp. 813
- Debreuil, N.¹ Knight, J.C.² Leventhal, D.³ Sandoghdar, V.⁴ Hare, J.⁵ Lefevre-Seguin, V.⁶

7
- 0001034528
- Knight J.C., Cheung G., Jacques F., Birks T.A. Opt. Lett. 22:1997;1129.
- (1997) Opt. Lett. , vol.22 , pp. 1129
- Knight, J.C.¹ Cheung, G.² Jacques, F.³ Birks, T.A.⁴

8
- 0000069013
- Ilchenko V.S., Yao X.S., Maleki L. Opt. Lett. 24:1999;723.
- (1999) Opt. Lett. , vol.24 , pp. 723
- Ilchenko, V.S.¹ Yao, X.S.² Maleki, L.³

9
- 0002240179
- Little B.E., Laine J.P., Lim D.R., Haus H.A., Kimerling L.C., Chu S.T. Opt. Lett. 25:2000;73.
- (2000) Opt. Lett. , vol.25 , pp. 73
- Little, B.E.¹ Laine, J.P.² Lim, D.R.³ Haus, H.A.⁴ Kimerling, L.C.⁵ Chu, S.T.⁶

10
- 0001512558
- Ishikawa H., Tamaru H., Miyano K. Opt. Lett. 24:1999;643.
- (1999) Opt. Lett. , vol.24 , pp. 643
- Ishikawa, H.¹ Tamaru, H.² Miyano, K.³

11
- 0027206040
- Lottici P.P., Bersani D., Braghini M., Montenero A. J. Mater. Sci. 28:1993;177.
- (1993) J. Mater. Sci. , vol.28 , pp. 177
- Lottici, P.P.¹ Bersani, D.² Braghini, M.³ Montenero, A.⁴

12
- 0033247335
- Shinya A., Fukui M. Opt. Rev. 6:1999;215.
- (1999) Opt. Rev. , vol.6 , pp. 215
- Shinya, A.¹ Fukui, M.²

13
- 0033247349
- Haraguchi M., Nakai T., Shinya A., Okamoto T., Fukui M., Koda T., Shimada R., Takeda K. Opt. Rev. 6:1999;261.
- (1999) Opt. Rev. , vol.6 , pp. 261
- Haraguchi, M.¹ Nakai, T.² Shinya, A.³ Okamoto, T.⁴ Fukui, M.⁵ Koda, T.⁶ Shimada, R.⁷ Takeda, K.⁸

14
- 0004270218
- New York: Harrick Scientific
- Harrick N.J. Internal Reflectance Spectroscopy. 1979;Harrick Scientific, New York. p. 17.
- (1979) Internal Reflectance Spectroscopy , pp. 17
- Harrick, N.J.¹

15
- 0003484845
- San Diego: Academic Press
- Brinker C.J., Scherer G.W. Sol-gel Science. 1990;Academic Press, San Diego. p. 845.
- (1990) Sol-gel Science , pp. 845
- Brinker, C.J.¹ Scherer, G.W.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.