-
2
-
-
0346517009
-
-
Bearmann GH, Levenson RM, Cabib D, editors; Dordrecht (Hingham, MA): Kluwer Academic Publishers
-
Bearmann GH, Levenson RM, Cabib D, editors. Spectral imaging: basic principles and prospective applications. Dordrecht (Hingham, MA): Kluwer Academic Publishers; 2002.
-
(2002)
Spectral Imaging: Basic Principles and Prospective Applications
-
-
-
3
-
-
19544393349
-
Direct sight imaging spectrograph: A unique add-on component brings spectral imaging to industrial applications
-
Hyvärinen T, Herrala E, Dall'Ava A. Direct sight imaging spectrograph: a unique add-on component brings spectral imaging to industrial applications. SPIE Symposium on Electronic Imaging 1998. p. 3302.
-
SPIE Symposium on Electronic Imaging 1998
, pp. 3302
-
-
Hyvärinen, T.1
Herrala, E.2
Dall'Ava, A.3
-
4
-
-
0037247783
-
On-line classification of synthetic polymers using near infrared spectral imaging
-
Kulcke A, Gurschler C, Spöck G, Leitner R, Kraft A. On-line classification of synthetic polymers using near infrared spectral imaging. Journal of Near-Infrared Spectroscopy 2003;11:71-81.
-
(2003)
Journal of Near-Infrared Spectroscopy
, vol.11
, pp. 71-81
-
-
Kulcke, A.1
Gurschler, C.2
Spöck, G.3
Leitner, R.4
Kraft, A.5
-
5
-
-
0012887049
-
-
van der Meer F, De John SM, editors; Dordrecht (Hingham, MA): Kluwer Academic Publishers
-
van der Meer F, De John SM, editors. Imaging spectrometry: basic principles and prospective applications. Dordrecht (Hingham, MA): Kluwer Academic Publishers; 2002.
-
(2002)
Imaging Spectrometry: Basic Principles and Prospective Applications
-
-
-
6
-
-
0012888716
-
-
Bearman GH, Levenson RM, Cabib D, editors; SPIE Publications
-
Bearman GH, Levenson RM, Cabib D, editors. Spectral Imaging: Instrumentation, Applications, and Analysis. SPIE Publications, 2000.
-
(2000)
Spectral Imaging: Instrumentation, Applications, and Analysis
-
-
-
8
-
-
0029752484
-
Four-color pyrometry for metal emissivity characterization
-
Hopkins MF. Four-color pyrometry for metal emissivity characterization. Proceedings of the SPIE 1995; 2599:294.
-
Proceedings of the SPIE 1995
, vol.2599
, pp. 294
-
-
Hopkins, M.F.1
-
9
-
-
0033688330
-
Imaging spectroscopy using tunable filters: A review
-
Gat N. Imaging spectroscopy using tunable filters: a review. Proceedings of the SPIE 2000; 4056:50.
-
Proceedings of the SPIE 2000
, vol.4056
, pp. 50
-
-
Gat, N.1
-
12
-
-
0012857275
-
Spectrometer apparatus
-
US Pat 1992;5166755
-
Gat N. Spectrometer apparatus. US Pat 1992;5166755.
-
-
-
Gat, N.1
-
14
-
-
0033020459
-
Quality measurements of fruits and vegetables
-
Abbott JA. Quality measurements of fruits and vegetables. Postharvest and Biology Technology 1995;15:207-25.
-
(1995)
Postharvest and Biology Technology
, vol.15
, pp. 207-225
-
-
Abbott, J.A.1
-
15
-
-
2342572284
-
Hyperspectral image analysis for measuring the ripeness of tomatoes
-
Polder G, van der Heijden GWAM, Young IT. Hyperspectral image analysis for measuring the ripeness of tomatoes. ASAE International Meeting, Paper No. 003089, Milwaukee, WI, 2000.
-
ASAE International Meeting, Paper No. 003089, Milwaukee, WI, 2000
-
-
Polder, G.1
Van Der Heijden, G.W.A.M.2
Young, I.T.3
-
16
-
-
0012843862
-
Hyperspectral imaging for poultry contaminant detection
-
Lawrence KC, Windham WR, Park B, Buhr RJ. Hyperspectral imaging for poultry contaminant detection. NIR News 2001;12(5):3-6.
-
(2001)
NIR News
, vol.12
, Issue.5
, pp. 3-6
-
-
Lawrence, K.C.1
Windham, W.R.2
Park, B.3
Buhr, R.J.4
-
18
-
-
33845271304
-
Spectral imaging for the classification of natural and artificial turquoise samples
-
Gurschler C, Serafino G, Spöck G, Del Bianco A, Kraft M, Kulcke A. Spectral imaging for the classification of natural and artificial turquoise samples. Int Conf OPTO, Erfurt 2002. p. 197.
-
Int Conf OPTO, Erfurt 2002
, pp. 197
-
-
Gurschler, C.1
Serafino, G.2
Spöck, G.3
Del Bianco, A.4
Kraft, M.5
Kulcke, A.6
-
19
-
-
34147138531
-
Classifiers for dissimilarity-based pattern recognition
-
In: Sanfeliu A, Villanueva JJ, Vanrell M, Alquezar R, Jain AK, Kittler J, editors; Los Alamitos: IEEE Computer Society Press
-
Pekalska E, Duin RPW. Classifiers for dissimilarity-based pattern recognition. In: Sanfeliu A, Villanueva JJ, Vanrell M, Alquezar R, Jain AK, Kittler J, editors. ICPR15, proceedings 15th Int. conference on pattern recognition (Barcelona, Spain, Sep.3-7), pattern recognition and neural networks, Vol. 2. Los Alamitos: IEEE Computer Society Press; 2000. p. 12-6.
-
(2000)
ICPR15, Proceedings 15th Int. Conference on Pattern Recognition (Barcelona, Spain, Sep.3-7), Pattern Recognition and Neural Networks
, vol.2
, pp. 12-16
-
-
Pekalska, E.1
Duin, R.P.W.2
|