A novel approach to micro-sample X-ray powder diffraction using nylon loops

Journal of Applied Crystallography

Volumn 36, Issue 6, 2003, Pages 1480-1481

  Bhuvanesh, Nattamai S P ^a   Reibenspies, Joseph H ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; NYLON;

ARTICLE; CRYSTAL STRUCTURE; DIFFRACTION; METHODOLOGY; RADIATION; X RAY POWDER DIFFRACTION;

EID: 0346118839     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803021885     Document Type: Article

References (5)

1. Bhuvanesh, N. S. P. & Reibenspies, J. H. (2003). Bruker CCD Users Meeting, Madison, Wisconsin: American. Crystallographic Association Meeting, Covington, KY.
2. Blanton, T., Hamilton, R., Iyenger, S., Jenkins, R., McMurdie, H., Nelson, D., Rasmussen, S., Rendle, D., Roach, G., Rybaa, E., Smith, D. & Wong-Ng, W. (1998). Practical Guide for the Preparation of Specimens for X-ray Fluorescence and X-ray Diffraction Analysis, edited by V. Buhrke, R. Jenkins & D. Smith, pp. 205-268. New York: John Wiley.
3. Hubbard, C. R., Swanson, H. E. & Mauer, F. A. (1975). J. Appl. Cryst. 8, 45-48.
4. Favre Nicolin, V. & Cerny, R. (2002). J. Appl. Cryst. 35, 734-743.
5. Teng, T.-Y. (1990). J. Appl. Cryst. 23, 387-391.